ÖZTÜRK, S. Et Al. 2018. Determination of lapping parameters for silicon wafer using an artificial neural network. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.29 , 260-270.

ÖZTÜRK, S., KAYABAŞI, E., ÇELİK, E., & KURT, H., (2018). Determination of lapping parameters for silicon wafer using an artificial neural network. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.29, 260-270.

ÖZTÜRK, SAVAŞ Et Al. "Determination of lapping parameters for silicon wafer using an artificial neural network," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.29, 260-270, 2018

ÖZTÜRK, SAVAŞ Et Al. "Determination of lapping parameters for silicon wafer using an artificial neural network." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.29, pp.260-270, 2018

ÖZTÜRK, S. Et Al. (2018) . "Determination of lapping parameters for silicon wafer using an artificial neural network." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.29, pp.260-270.

@article{article, author={SAVAŞ ÖZTÜRK Et Al. }, title={Determination of lapping parameters for silicon wafer using an artificial neural network}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2018, pages={260-270} }