Determination of the onset temperatures for the drop in resistivity and the increase in grain size for Cu alloy films by in situ sheet resistance and in situ synchrotron x-ray diffraction measurements

GÜNGÖR A. , BARMAK K., CABRAL C., HARPER J.

IInternational Advanced Technologies Symposium (IATS’2009), Karabük, Türkiye, 13 - 15 Mayıs 2009

  • Basıldığı Şehir: Karabük
  • Basıldığı Ülke: Türkiye