Effect of pH on Optic and Structural Characterization of Chemical Deposited AgI Thin Films


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MEYDANERİ TEZEL F. , KARİPER İ. A.

MATERIALS RESEARCH-IBERO-AMERICAN JOURNAL OF MATERIALS, cilt.20, ss.1563-1570, 2017 (SCI İndekslerine Giren Dergi) identifier identifier

  • Cilt numarası: 20 Konu: 6
  • Basım Tarihi: 2017
  • Doi Numarası: 10.1590/1980-5373-mr-2017-0319
  • Dergi Adı: MATERIALS RESEARCH-IBERO-AMERICAN JOURNAL OF MATERIALS
  • Sayfa Sayıları: ss.1563-1570

Özet

AgI thin films were grown on amorphous commercial glass substrates with chemical bath deposition (CBD) at different pH values (2, 3, 4, 5, 6), 6 hours deposition time and 60 degrees C. The structure of the nanocrystals was characterized by X-ray diffraction (XRD). The ratio of Ag+ and I-ions changed the crystalline structures. The presence of the Ag+ ions produces the.-phase of AgI and excess of iodine concentration produces beta-phase of AgI. The pH: 4 was like a transition pH for these phases. The number of crystallites per unit area has maximum value at pH: 5, as the structure is re-crystallization to hexagonal phase. Also, the thicknesses of produced thin films were decreased with increased pH values. Therefore, transmission, reflection, extinction coefficients and refractive index of the materials were affected by thicknesses, and calculated to be 32, 35, 3, 11, 9 (%) - 27, 25, 61, 45, 49 (%) - 0.036, 0.032, 0.067, 0.107, 0.075 and 3.21, 3.02, 5.16, 8.35, 5.70 in 550 nm at pH: 2-3-4-5-6 values, respectively. The exciton peaks of AgI were observed at between 320 and 420 nm. Surface properties were investigated by using scanning electron microscopy (SEM).