Auger electron (AE) spectroscopy is an important surface-analysis tool for conductive materials. However, the technique has a serious drawback. i.e., the absence of automated spectra analyses. The goal of our research work, therefore, was to find a way towards the automatic analysis of AE spectra, and in this paper we describe how the analysis of AE spectral noise is one of the reasons preventing automatic analyses. Knowing the properties of noise is a key to knowing the true shape of the spectral background, as well as the shape of the characteristic AE peaks. We are not interested in the properties of the noise in the sense of how and what generates it, rather we want to discover what are its manifestations and consequences from the signal-processing point of view. In the paper we give answers to several important noise-related (measured and simulated) questions: Does the noise amplitude level vary with the kinetic energy? Is the measured noise "white noise"? Is the noise temperature dependent? The answers to these questions also indicate how we can extract the AE spectral noise.