Determination of micro sized texturing and nano sized etching procedure to enhance optical properties of n-type single crystalline silicon wafer


KAYABAŞI E. , KURT H., ÇELİK E.

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, cilt.28, ss.14085-14090, 2017 (SCI İndekslerine Giren Dergi) identifier identifier

  • Cilt numarası: 28 Konu: 18
  • Basım Tarihi: 2017
  • Doi Numarası: 10.1007/s10854-017-7260-4
  • Dergi Adı: JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
  • Sayfa Sayıları: ss.14085-14090

Özet

Crystalline silicon (c-Si) wafer was manufactured by applying micro texture and nano etching process without lapping and polishing for solar cell applications. Before micro texture and nano etching, wafers were exposed to chemical polishing process in high concentrated alkaline solution to remove saw damages and obtain a surface with low surface roughness (R-a). Uniform pyramidal structures were formed in alkaline solution. On pyramidal structures, nano sized porous shapes were formed by using Ag nano particles via wet chemical etching method. Micro textured and nano etched surface formed without any chemical mechanical (CM) lapping and polishing step, examined by Scanning Electron Microscope (SEM) for surface structure and UV-visible spectrometer for reflectance and absorbance measurements. Considerably good uniform porous surface with low reflectance was formed and compared with usual solar wafers produced with CM lapping and polishing. Furthermore, present process for preparing solar cell provides low cost, short time and less material consumption by removing lapping and polishing steps from overall process. Reflectance values were measured between 7 and 10% for best micro textured and nano etched c-Si wafers, respectively. Absorbance values were measured 0.4 and 1.2% for best micro textured and nano etched c-Si wafers, respectively. Curves of versus indicated the optical band gaps almost 1.12 e.V. for all wafers cut from same n-type single c-Si ingot.